Techniques for analyzing stress and strain in epitaxial films are at the heart of the scientific advances of the PEPR Electronics program. Driven by the RENATECH network and the PFNC at CEA-Leti, 80 participants from CNRS, universities, CEA, and our industrial partners gathered on January 12–13, 2026, at C2N for the CODEFI workshop. Experts notably discussed the strengths, limitations, and complementarity of each analysis technique: XRD, curvature measurements, Raman, PL, CL, TEM, and SAT.
Organizers: Ludovic Largeau (C2N), Patrice Gergaud (CEA/LETI/PFNC)
