Centre for Nanoscience
and Nanotechnology

Events

Published the Oct. 4, 2019

Workshop ZEISS at C2N - Electron, Ion and X-ray microscopy, Octobre 24th

On October 24th, a Workshop ZEISS will take place at C2N about: "Electron, Ion and X-ray microscopy for nanotechnologies characterization". Microscopy is evolving: imaging is a key tool in many areas of application in research, involving automation and ever more advanced performance.

Members of C2N, including platform engineers, platform managers and researchers, will introduce the microscopy platforms used at the lab and their applications in nanoscience, nanotechnology and metrology:

  • Micro and Nano-Technologies Innovation Platform (PIMENT) // Lithography, etching, thin film deposition and measurement/control;

  • Material Analysis Platform (PANAM) // DRX applied to nanostructures, TEM, AFM;

  • A few examples of applications with the Orion Nanofab microscope;

  • Implementation of a traceability chain for dimensional measurements at the nanometric scale conducted by AFM and SEM, in collaboration C2N/LNE;

  • Examples of application using a SEM in nanotechnology;

  • Characterization of Getters films for vacuum;

  • TEMPOS EquipEx // A unique platform for electron microscopy accessible to all researchers in the Paris-Saclay area.

Representatives of ZEISS will introduce the latest advances in microscopy applied to materials science, as well as a selection of equipments in their range of automated microscopes.

 

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Conclusion of a cooperation agreement with the Korea Electronics Technology Institute

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